Design, conception, and metrology of EUV mirrors for aggressive environments

The development of new high power EUV sources and EUV space imaging requires optics having specific properties which depend on applications and operating conditions. These both applications are very different in the working multilayers environment. For the high power sources, multilayers are submitted to short pulses with high energy peak whereas, for the space imaging, multilayers are submitted to continuous flux with low level. Moreover photon energy and environment for both applications may be different. The environment may affect structure and top layer contamination when optics are stored, handled, mounted on the final device and finally operating. Main environmental parameters investigated are temperature and humidity variation. One objective is the optimisation of multilayer coatings to offer the highest resistance under photonic, ionic fluxes and temperature cycle. This means that interfacial diffusion between thin layers and degradation of the capping layers have to be avoided or reduced. The present study relies with designing, depositing and testing different structures of multilayer coatings in order to minimise the influence of the environment. Multilayer coatings based on molybdenum, silicon and silicon carbide materials have been deposited by magnetron sputtering on silicon and zerodur substrates. Samples were submitted to radiations emitted by an EUV source at wavelength closed to 13.5 nm. Furthermore they were also submitted to thermal cycles and annealing under warm humidity in the aim to simulate extremes storage or handling conditions as space mission's conditions. The damages and the performance of the multilayers were evaluated by using grazing incidence reflectometry at 0.154 nm and EUV reflectometry at the operating wavelength. After a presentation of the multilayer design, deposition and metrology tools, we will describe the different environmental effects on the coatings to take in care during EUV source exposure, handling and storage conditions. First results on multilayers performances to EUV source exposure and space specification tests are presented. Main damages studies were on annealing, thermal cycling and warm humidity.

[1]  F. Bridou,et al.  Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry , 1990 .

[2]  S. Bajt,et al.  Investigation of the amorphous-to-crystalline transition in Mo/Si multilayers , 2001 .

[3]  Jean-Pierre Delaboudiniere,et al.  Ion beam deposited Mo/Si multilayers for EUV imaging applications in astrophysics , 2004, SPIE Optical Systems Design.

[4]  J. Gautier,et al.  Study of normal incidence of three-component multilayer mirrors in the range 20-40 nm. , 2005, Applied optics.

[5]  Ch. Hecquet,et al.  Réflectomètre à large spectre EUV pour la métrologie d'optiques , 2006 .

[6]  J. Gautier,et al.  Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers , 2006 .

[7]  E. Gullikson,et al.  A Soft X-Ray/EUV Reflectometer Based on a Laser Produced Plasma Source. , 1992, Journal of X-ray science and technology.

[8]  H. Takenaka,et al.  Design and fabrication of highly heat-resistant Mo/Si multilayer soft X-ray mirrors with interleaved barrier layers. , 1998, Journal of synchrotron radiation.

[9]  Berend Winter,et al.  Stability of EUV multilayers to long-term heating, and to energetic protons and neutrons, for extreme solar missions , 2005, SPIE Optics + Photonics.

[10]  F. Bridou,et al.  Optiques multicouches pour l'extrême UV , 2005 .

[11]  Brian E. Jurczyk,et al.  Experimental test chamber design for optics exposure testing and debris characterization of a xenon discharge produced plasma source for extreme ultraviolet lithography , 2006 .

[12]  F. Scholze,et al.  High-accuracy radiometry in the EUV range at the PTB soft x-ray beamline , 2003 .

[13]  Vivek Bakshi,et al.  EUV Sources for Lithography , 2006 .