Depth distribution of Frank loop defects formed in ion-irradiated stainless steel and its dependence on Si addition
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Zhengcao Li | N. Soneda | K. Nishida | N. Sekimura | Kenta Murakami | Dongyue Chen | Li Liu | K. Dohi
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Zhengcao Li | N. Soneda | K. Nishida | N. Sekimura | Kenta Murakami | Dongyue Chen | Li Liu | K. Dohi