SeparateIDDQ testing of signal and bias paths in CMOS ICs for defect diagnosis
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[1] Resve Saleh,et al. Analysis and Design of Digital Integrated Circuits , 1983 .
[2] Charles F. Hawkins,et al. IDDQ testing: A review , 1992, J. Electron. Test..
[3] Charles F. Hawkins,et al. CMOS IC fault models, physical defect coverage, and I/sub DDQ/ testing , 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.
[4] Roger Perry. I/sub DDQ/ TESTING IN CMOS DIGITAL ASIC'S - PUTTING IT ALL TOGETHER , 1992, Proceedings International Test Conference 1992.
[5] Carver Mead. Scaling of MOS technology to submicrometer feature sizes , 1994, J. VLSI Signal Process..
[6] J. Burr,et al. Ultra low power CMOS technology , 1991 .
[7] Charles F. Hawkins,et al. Quiescent power supply current measurement for CMOS IC defect detection , 1989 .
[8] G. Schiessler,et al. IDDQ test results on a digital CMOS ASIC , 1993, Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93.
[9] R. Troutman. Subthreshold design considerations for insulated gate field-effect transistors , 1973 .
[10] H. B. Bakoglu,et al. Circuits, interconnections, and packaging for VLSI , 1990 .
[11] Paul C. Wiscombe,et al. A comparison of stuck-at fault coverage and I/sub DDQ/ testing on defect levels , 1993, Proceedings of IEEE International Test Conference - (ITC).
[12] J.W. Slotboom,et al. Impact of silicon substrates on leakage currents , 1983, IEEE Electron Device Letters.
[13] J. Shott,et al. A 200 mV self-testing encoder/decoder using Stanford ultra-low-power CMOS , 1994, Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '94.
[14] Thomas M. Storey,et al. STUCK FAULT AND CURRENT TESTING COMPARISON USING CMOS CHIP TEST , 1991, 1991, Proceedings. International Test Conference.
[15] H. Grubin. The physics of semiconductor devices , 1979, IEEE Journal of Quantum Electronics.
[16] Daniel W. Dobberpuhl,et al. The design and analysis of VLSI circuits , 1985 .
[17] Wojciech Maly,et al. Design of ICs applying built-in current testing , 1992, J. Electron. Test..