论文信息 - A SET-hardened phase-locked loop

A SET-hardened phase-locked loop

A single-event-transient-hardened-by-design (SET-HBD) charge pump (CP) is proposed to improve the reliability of the phase-locked loop (PLL) in SMIC 0.18μm CMOS process. And, the SET-HBD PLL is designed by adopting the proposed SET-HBD CP instead of the traditional CP. Simulation results show that the designed SET-HBD PLL, which is compared with the general PLL (GPLL), has better performances including lower perturbation ΔVctrι of the control voltage Vctri, faster recovery time of the locked PLL and smaller maximum-phase displacement of the feedback clock.

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