Growth of Thick 4H–SiC(0001) Epilayers and Reduction of Basal Plane Dislocations
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H. Tsuchida | I. Kamata | Y. Sugawara | K. Nakayama | Tomonori Nakamura | R. Ishii | Toshiyuki Miyanagi
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H. Tsuchida | I. Kamata | Y. Sugawara | K. Nakayama | Tomonori Nakamura | R. Ishii | Toshiyuki Miyanagi