Nano‐characterization of Cast Structures by FIB‐Tomography

In this communication, the three dimensional architectures of different Al-Si-(Mg) alloys are analyzed using SEM (Scanning Electron Microscopy)/FIB (Focus Ion Beam), EDS (Energy Dispersive Spectroscopy)/FIB and SEM-EDS/FIB tomographic methods. Several aspects for the imaging and quantification of the results are discussed describing the advantages and limitations of the methods to resolve submicron structures.

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