Analysis Of Feedback Structures In Fet Circuits

Common numerical approaches for determining a cir-cuit's dc operating points usually yield no more than one solution. Even applications of homotopy methods have performed with a limited success. We propose here a new method: a combination of investigating the circuit's topology and analyzing the circuit numerically. The method, named test for positive feedback structures, was previously introduced to determine which bipolar transistor, being part of a feedback structure, can cause positive feedback, and if so, what will be the circuit's operating points. In this paper we show that the method can be extended also to circuits with eld eeect transistors (FET's).

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