Direct probing of imperfection-induced electrical degradation in millimeter-scale graphene on SiO2 substrates
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Hongjun Gao | S. Pantelides | Hongtao Liu | W. Guo | Xiao Lin | L. Bao | Ruisong Ma | Q. Huan | Liangmei Wu | Jiahao Yan | Shuai Wang | Jiajun Ma