Improved read/write assist mechanism for 10‐transistor static random access memory cell
暂无分享,去创建一个
[1] M. Gholipour,et al. A Reliable Low Standby Power 10T SRAM Cell With Expanded Static Noise Margins , 2022, IEEE Transactions on Circuits and Systems I: Regular Papers.
[2] M. Gholipour,et al. Correction: A 9T high-stable and Low-Energy Half-Select-Free SRAM Cell Design using TMDFETs , 2022, Analog Integrated Circuits and Signal Processing.
[3] M. Gholipour,et al. Ultra-low-power and stable 10-nm FinFET 10T sub-threshold SRAM , 2022, Microelectron. J..
[4] R. Paily,et al. Half‐selection disturbance free 8T low leakage SRAM cell , 2022, Int. J. Circuit Theory Appl..
[5] M. Gholipour,et al. A Schmitt-Trigger-Based Low-Voltage 11 T SRAM Cell for Low-Leakage in 7-nm FinFET Technology , 2022, Circuits, Systems, and Signal Processing.
[6] M. Gholipour,et al. A low‐leakage single‐bitline 9T SRAM cell with read‐disturbance removal and high writability for low‐power biomedical applications , 2022, Int. J. Circuit Theory Appl..
[7] Neeta Pandey,et al. A novel PVT‐variation‐tolerant Schmitt‐trigger‐based 12T SRAM cell with improved write ability and high ION/IOFF ratio in sub‐threshold region , 2021, Int. J. Circuit Theory Appl..
[8] Shilpi Birla,et al. A Comprehensive Analysis of Different SRAM Cell Topologies in 7-nm FinFET Technology , 2021, Silicon.
[9] Morteza Gholipour,et al. Design of a Schmitt-Trigger-Based 7T SRAM cell for variation resilient Low-Energy consumption and reliable internet of things applications , 2021, AEU - International Journal of Electronics and Communications.
[10] Morteza Gholipour,et al. Performance evaluation of GNRFET and TMDFET devices in static random access memory cells design , 2021, Int. J. Circuit Theory Appl..
[11] Morteza Gholipour,et al. Half-select disturb-free single-ended 9-transistor SRAM cell with bit-interleaving scheme in TMDFET technology , 2021, Microelectron. J..
[12] Morteza Gholipour,et al. Single‐ended half‐select disturb‐free 11T static random access memory cell for reliable and low power applications , 2021, Int. J. Circuit Theory Appl..
[13] Poornima Mittal,et al. Single bit line accessed high‐performance ultra‐low voltage operating 7T static random access memory cell with improved read stability , 2021, Int. J. Circuit Theory Appl..
[14] Neeta Pandey,et al. A data‐independent 9T SRAM cell with enhanced ION/IOFF ratio and RBL voltage swing in near threshold and sub‐threshold region , 2021, Int. J. Circuit Theory Appl..
[15] M. Gholipour,et al. A variation-aware design for storage cells using Schottky-barrier-type GNRFETs , 2020 .
[16] Bipin Chandra Mandi,et al. Design and statistical analysis of low power and high speed 10T static random access memory cell , 2020, Int. J. Circuit Theory Appl..
[17] Neeta Pandey,et al. A low power subthreshold Schmitt Trigger based 12T SRAM bit cell with process-variation-tolerant write-ability , 2020, Microelectron. J..
[18] S. M. Swamynathan,et al. Stability Enhancing SRAM cell for low power LUT Design , 2020, Microelectron. J..
[19] Wing-Hung Ki,et al. Reliable write assist low power SRAM cell for wireless sensor network applications , 2020, IET Circuits Devices Syst..
[20] Xin Si,et al. A Half-Select Disturb-Free 11T SRAM Cell With Built-In Write/Read-Assist Scheme for Ultralow-Voltage Operations , 2019, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[21] Benton H. Calhoun,et al. Low-Power Near-Threshold 10T SRAM Bit Cells With Enhanced Data-Independent Read Port Leakage for Array Augmentation in 32-nm CMOS , 2019, IEEE Transactions on Circuits and Systems I: Regular Papers.
[22] Kari Halonen,et al. A write‐improved low‐power 12T SRAM cell for wearable wireless sensor nodes , 2018, Int. J. Circuit Theory Appl..
[23] Mohd. Hasan,et al. Low Leakage Fully Half-Select-Free Robust SRAM Cells With BTI Reliability Analysis , 2018, IEEE Transactions on Device and Materials Reliability.
[24] Jinn-Shyan Wang,et al. A 0.2 V 32-Kb 10T SRAM With 41 nW Standby Power for IoT Applications , 2018, IEEE Transactions on Circuits and Systems I: Regular Papers.
[25] Santosh Kumar Vishvakarma,et al. Stable, Reliable, and Bit-Interleaving 12T SRAM for Space Applications: A Device Circuit Co-Design , 2017, IEEE Transactions on Semiconductor Manufacturing.
[26] Jongsun Park,et al. Half-Select Free and Bit-Line Sharing 9T SRAM for Reliable Supply Voltage Scaling , 2017, IEEE Transactions on Circuits and Systems I: Regular Papers.
[27] Hanwool Jeong,et al. Power-Gated 9T SRAM Cell for Low-Energy Operation , 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[28] Soumitra Pal,et al. Variation Tolerant Differential 8T SRAM Cell for Ultralow Power Applications , 2016, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[29] Soumitra Pal,et al. 9-T SRAM Cell for Reliable Ultralow-Power Applications and Solving Multibit Soft-Error Issue , 2016, IEEE Transactions on Device and Materials Reliability.
[30] Mohd. Hasan,et al. Single-Ended Schmitt-Trigger-Based Robust Low-Power SRAM Cell , 2016, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[31] Sied Mehdi Fakhraie,et al. A 256-kb 9T Near-Threshold SRAM With 1k Cells per Bitline and Enhanced Write and Read Operations , 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[32] Ming-Hsien Tu,et al. 40 nm Bit-Interleaving 12T Subthreshold SRAM With Data-Aware Write-Assist , 2014, IEEE Transactions on Circuits and Systems I: Regular Papers.
[33] Sied Mehdi Fakhraie,et al. An 8T Low-Voltage and Low-Leakage Half-Selection Disturb-Free SRAM Using Bulk-CMOS and FinFETs , 2014, IEEE Transactions on Electron Devices.
[34] Ching-Te Chuang,et al. Low-Power Multiport SRAM With Cross-Point Write Word-Lines, Shared Write Bit-Lines, and Shared Write Row-Access Transistors , 2014, IEEE Transactions on Circuits and Systems II: Express Briefs.
[35] Kaushik Roy,et al. Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design , 2012, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[36] Zhi-Hui Kong,et al. An 8T Differential SRAM With Improved Noise Margin for Bit-Interleaving in 65 nm CMOS , 2011, IEEE Transactions on Circuits and Systems I: Regular Papers.