Refractive indices of AlSb and GaSb‐lattice‐matched AlxGa1−xAsySb1−y in the transparent wavelength region

The refractive indices of AlSb grown by the solute diffusion method and GaSb‐lattice‐matched AlxGa1−xAsySb1−y alloy grown by liquid‐phase epitaxy have been determined at room temperature from accurate measurements of the reflectance of p‐polarized light as a function of the angle of incidence. The refractive index variations versus the photon energy were obtained in the spectral range 0.5–1.5 eV. Experimental data in the transparent wavelength region could be matched by calculated curves on the basis of a single‐oscillator model.

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