论文信息 - SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

This paper explains the inconsistencies reported between effective flux calculations and integral rectangular parallelepiped calculations. The two types of calculation yield consistent results when the effective flux calculation is performed allowing for the appropriate geometry. A set of generic heavy ion cross section curves is introduced so that upset rate calculations can be compared as a function of device area and threshold. The figure of merit approximation is generalized so that it can be used for any orbit.

E. L. Petersen

[1] Edward Petersen,et al. Geometrical factors in SEE rate calculations , 1993 .

[2] J. C. Pickel,et al. Rate prediction for single event effects-a critique , 1992 .

[3] D. Binder. Analytic SEU rate calculation compared to space data , 1988 .

[4] S. E. Diehl,et al. Suggested Single Event Upset Figure of Merit , 1983, IEEE Transactions on Nuclear Science.

[5] James C. Pickel,et al. Cosmic-Ray-Induced Errors in MOS Devices , 1980, IEEE Transactions on Nuclear Science.

[6] D. Binder,et al. Satellite Anomalies from Galactic Cosmic Rays , 1975, IEEE Transactions on Nuclear Science.

[7] E. A. Burke,et al. Calculation of Cosmic-Ray Induced Soft Upsets and Scaling in VLSI Devices , 1982, IEEE Transactions on Nuclear Science.

[8] E. Normand,et al. Single event upset and charge collection measurements using high energy protons and neutrons , 1994 .

[9] F. W. Sexton,et al. Modeling the heavy ion upset cross section , 1995 .