Test Generation Algorithms for Computer Hardware Description Languages

This paper proposes an extension of the D-algorithm to functions described in computer hardware description languages. The proposed extension is applicable to both procedural and nonprocedural languages. Methods of D-propagation through the basic constructs of these languages and test generation for circuits containing functions described in CHDL's are discussed. The fault modes considered are function variables stuck at 0 or 1, control faults, and function faults with user-specified faulty behaviors.

[1]  David A. Huffman,et al.  The synthesis of sequential switching circuits , 1954 .

[2]  J. F. Poage,et al.  Derivation of optimum tests to detect faults in combinational circuits , 1962 .

[3]  Douglas B. Armstrong,et al.  On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets , 1966, IEEE Trans. Electron. Comput..

[4]  Donald R. Haring,et al.  Multi-threshold threshold elements , 1966, IEEE Trans. Electron. Comput..

[5]  J. Paul Roth,et al.  Diagnosis of automata failures: a calculus and a method , 1966 .

[6]  F. F. Sellers,et al.  Analyzing Errors with the Boolean Difference , 1968, IEEE Transactions on Computers.

[7]  J. Paul Roth,et al.  A Heuristic Algorithm for the Testing of Asynchronous Circuits , 1971, IEEE Transactions on Computers.

[8]  Mu Yue Hsiao,et al.  Boolean Difference for Fault Detection in Asynchronous Sequential Machines , 1971, IEEE Transactions on Computers.

[9]  B. Shahdad A Digital System Design Language , 1974 .

[10]  G. W. Smith,et al.  Lamp: System description , 1974 .

[11]  S. G. Chappell Lamp: Automatic test generation for asynchronous digital circuits , 1974 .

[12]  Premachandran R. Menon,et al.  Functional simulation in the lamp system , 1976, DAC '76.

[13]  David Kinniment,et al.  A Design Language for Asynchronous Logic , 1978, Comput. J..

[14]  Premachandran R. Menon,et al.  Deductive Fault Simulation with Functional Blocks , 1978, IEEE Transactions on Computers.

[15]  Jacob A. Abraham,et al.  TEST GENERATION FOR GENERAL MICROPROCESSOR ARCHITECTURES. , 1979 .

[16]  Melvin A. Breuer,et al.  Functional Level Primitives in Test Generation , 1980, IEEE Transactions on Computers.

[17]  Jacob A. Abraham,et al.  Test Generation for Microprocessors , 1980, IEEE Transactions on Computers.