论文信息 - Gracefully degrading triple modular redundancy in FPGA design with application to harsh radiation environments

Gracefully degrading triple modular redundancy in FPGA design with application to harsh radiation environments

Space applications form a harsh computing environment, especially for sensitive VLSI electronics. Circuits experience both Single Event Upsets (SEUs), as well as permanent failures as a result of incoming electrons, protons, heavy ions, plasmas etc. We propose a Triple Modular Redundancy system that handles transient errors and gracefully degrades the capabilities of the system in the case of a permanent failure, implemented in Xilinx FPGAs. The system was tested in a strong EM field generated by a magnetron which includes X-rays and Gamma rays, yielding promising results for developing an indigenous, full-fledged process validation for space electronics.

Andrei Voinescu | Eng Dragos-Ronald Rugescu

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