Stochastic Gamma Process Degradation Failure Analysis

As there exist quality characteristics that degradation over time can be related to reliability, reliability assessment from degradation measures is more effective than the traditional one. Because deterioration is uncertain over time, it should ideally be represented as a stochastic process. In this paper, a stochastic Gamma process model was presented to analyze the degradation failure process. Because it was difficult to obtain an analytical expression for the distribution of first passage time, a simulation method was represented to analyze the failure distribution. In the end, the methodology was demonstrated and validated in the reliability analysis of metallized film pulse capacitors.