Capacitance–Voltage Characterization of GaAs–Oxide Interfaces
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Christoph Adelmann | Marc Heyns | Marc Meuris | Guy Brammertz | Matty Caymax | Clement Merckling | Sonja Sioncke | Wei-E Wang | David Mercier | Koen Martens | C. Merckling | C. Adelmann | M. Caymax | M. Heyns | S. Sioncke | M. Meuris | K. Martens | G. Brammertz | H. Lin | J. Penaud | D. Mercier | Wei-e Wang | J. Penaud | H. C Lin | Wei-E. Wang | H. Lin
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