Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls
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J. Eymery | M. Tchernycheva | F. Vurpillot | I. Blum | L. Rigutti | C. Durand | L. Mancini | J. Houard | W. Lefebvre | D. Hernández-Maldonado