论文信息 - Edge effects and a method of defect sizing for transient thermography

Edge effects and a method of defect sizing for transient thermography

Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.

Darryl P Almond | D. Almond | S. K. Lau

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