Fullerene-assisted electron-beam lithography for pattern improvement and loss reduction in InP membrane waveguide devices.
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J. V. D. van der Tol | B. Smalbrugge | Y. Jiao | E. Geluk | J. Pello | M. Smit | Longfei Shen | A. M. Mejia
暂无分享,去创建一个
J. V. D. van der Tol | B. Smalbrugge | Y. Jiao | E. Geluk | J. Pello | M. Smit | Longfei Shen | A. M. Mejia