Symmetry Detection Using Line Features
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Hans-Peter Seidel | Michael Wand | Andreas Schilling | Martin Bokeloh | Alexander Berner | H. Seidel | Martin Bokeloh | Michael Wand | A. Schilling | A. Berner | M. Wand | M. Bokeloh
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Hans-Peter Seidel | Michael Wand | Andreas Schilling | Martin Bokeloh | Alexander Berner | H. Seidel | Martin Bokeloh | Michael Wand | A. Schilling | A. Berner | M. Wand | M. Bokeloh