Quantifying EMI resulting from finite-impedance reference planes
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Todd H. Hubing | Fei Sha | T. P. Van Doren | D. M. Hockanson | Cheung-Wei Lam | J. L. Dreniak | D. Hockanson | T. Hubing | T. V. Doren | F. Sha | C. Lam
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