Application of Kriging and Radial Basis Function for Reliability Optimization in Power Modules
暂无分享,去创建一个
Hua Lu | Stoyan Stoyanov | Chris Bailey | Pushparajah Rajaguru | Hua Lu | C. Bailey | S. Stoyanov | P. Rajaguru
[1] Noel Y. A. Shammas,et al. Present problems of power module packaging technology , 2003, Microelectron. Reliab..
[2] Tim Tilford,et al. Reliability of Power Electronic Modules , 2007 .
[3] M. Yovanovich,et al. Modeling of Cylindrical Pin-Fin Heat Sinks for Electronic Packaging , 2008, IEEE Transactions on Components and Packaging Technologies.
[4] Guna S Selvaduray,et al. Solder joint fatigue models: review and applicability to chip scale packages , 2000 .
[5] C. Basaran,et al. Failure modes and FEM analysis of power electronic packaging , 2002 .
[6] Gerard Coquery,et al. Investigation of the heel crack mechanism in Al connections for power electronics modules , 2011, Microelectron. Reliab..
[7] Gerhard Wachutka,et al. Crack mechanism in wire bonding joints , 1998 .
[8] Chris Bailey,et al. Design for reliability of power electronics modules , 2009, Microelectron. Reliab..
[9] Wolfgang Fichtner,et al. Lifetime estimation of aluminium wire bonds based on computational plasticity , 2000 .
[10] Patrick McCluskey,et al. Wire Flexure Fatigue Model for Asymmetric Bond Height , 2003 .
[11] W. D. van Driel,et al. Reliability of wirebonds in micro‐electronic packages , 2008 .
[12] D. Vose. Risk Analysis: A Quantitative Guide , 2000 .
[13] Kwang‐Yong Kim,et al. Shape Optimization of Micro-Channel Heat Sink for Micro-Electronic Cooling , 2008, IEEE Transactions on Components and Packaging Technologies.
[14] Ramani Duraiswami,et al. Fast Radial Basis Function Interpolation via Preconditioned Krylov Iteration , 2007, SIAM J. Sci. Comput..
[15] Gerhard Wachutka,et al. Reliability model for Al wire bonds subjected to heel crack failures , 2000 .
[16] F. Theunis,et al. Prediction of high cycle fatigue in aluminum bond wires: A physics of failure approach combining experiments and multi-physics simulations , 2006, EuroSime 2006 - 7th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems.
[17] S. Lefebvre,et al. Thermal fatigue and failure of electronic power device substrates , 2009 .
[18] Hua Lu,et al. Lifetime Prediction for Power Electronics Module Substrate Mount-down Solder Interconnect , 2007, 2007 International Symposium on High Density packaging and Microsystem Integration.
[19] Keqin Ding,et al. Latin hypercube sampling used in the calculation of the fracture probability , 1998 .
[20] Robert Haining,et al. Statistics for spatial data: by Noel Cressie, 1991, John Wiley & Sons, New York, 900 p., ISBN 0-471-84336-9, US $89.95 , 1993 .
[21] Stephane Azzopardi,et al. An investigation into the reliability of power modules considering baseplate solders thermal fatigue in aeronautical applications , 2009, Microelectron. Reliab..
[22] Chris Bailey,et al. Rapid solutions for application specific IGBT module design , 2007 .
[23] J. M. Coulson,et al. Heat Transfer , 2018, Finite Element Method for Solids and Structures.
[24] Guirong Liu,et al. A point interpolation meshless method based on radial basis functions , 2002 .
[25] Stéphane Lefebvre,et al. Boundary element analysis of thermal fatigue effects on high power IGBT modules , 2004, Microelectron. Reliab..
[26] Michel Mermet-Guyennet,et al. Reliability of lead-free solder in power module with stochastic uncertainty , 2009, Microelectron. Reliab..
[27] C.M. Johnson,et al. Computer modelling analysis of the globtop’s effects on aluminium wirebond reliability , 2008, 2008 2nd Electronics System-Integration Technology Conference.
[28] M. Held,et al. Fast power cycling test for insulated gate bipolar transistor modules in traction application , 1999 .
[29] Mauro Ciappa,et al. Selected failure mechanisms of modern power modules , 2002, Microelectron. Reliab..
[30] Samuel Kotz,et al. Process Capability Indices , 1993 .