In situ strain measurement in the chip formation zone during orthogonal cutting

The strain and stress state in the chip formation zone determines the chip formation. However, it is difficult to obtain experimental data about the strain/stress fields during machining. For this reason, present chip formation models highly simplify the chip formation process. In order to extend the knowledge regarding the chip formation mechanisms, an experimental method for the in situ measurement of the elastic deformations within the chip formation zone during the cutting process has been developed. Using these deformations, the stress state can subsequently be calculated. The method is based on X-ray diffraction using high-energy synchrotron X-radiation during machining the workpiece in an orthogonal cutting process under quasistatic experimental conditions. The diffraction patterns are captured with a 2D detector. A comparison of the experimentally determined stresses at different measuring positions within the chip formation zone with results from a FEM cutting simulation shows a good qualitative and partially also quantitative consistency. Possibilities for the further performance increase of the method are identified so that the method can be used for the verification and extension of existing chip formation models in future.