Coupling of transient ultra wide band electro-magnetic fields to complex electronic systems

In this paper the coupling of transient ultra wide band field pulses to complex electronic systems is determined. Different test setups of microcontroller circuits were used to investigate the coupling effects and to describe the injected interference parameters.

[1]  J. R. Taylor,et al.  High Power Fibre Integrated Sources , 2006 .

[2]  M. Camp,et al.  Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis , 2004, IEEE Transactions on Electromagnetic Compatibility.

[3]  Heyno Garbe,et al.  Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses , 2002, 2002 IEEE International Symposium on Electromagnetic Compatibility.

[4]  M. Camp,et al.  Parameter estimation of double exponential pulses (EMP, UWB) with least squares and Nelder Mead algorithm , 2004, IEEE Transactions on Electromagnetic Compatibility.

[5]  Heyno Garbe,et al.  UWB and EMP susceptibility of modern electronics , 2001, 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161).

[6]  John A. Nelder,et al.  A Simplex Method for Function Minimization , 1965, Comput. J..

[7]  Clayborne D. Taylor,et al.  High Power Microwave Systems And Effects , 1994 .