Application of holographic pattern measuring system for deformation analysis of printed circuit board due to thermal stress
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[1] Hjalmar Hesselbom,et al. Elastomer chip sockets for reduced thermal mismatch problems and effortless chip replacement, preliminary investigations , 2003 .
[2] Jukka Rantala,et al. Enhanced electronic system reliability - challenges for temperature prediction , 2002 .
[3] A. J. Wilkinson,et al. An investigation of the sensitivity of embedded passive component temperatures to PCB structure , 2002 .
[4] Hai Ding,et al. Warpage measurement comparison using shadow moire and projection moire methods , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
[5] Marta Rencz,et al. Increasing the accuracy of thermal transient measurements , 2002 .
[6] David S. De Lorenzo. Thermal design of a high-density server , 2002 .
[7] M. Rencz,et al. Thermal evaluation and modeling of MEMS packages , 2000 .