Properties of continuous analog estimators for a discrete reliability-growth model

A discrete reliability-growth model (appropriate for success-failure data) whose derivation parallels that of a popular nonhomogeneous Poisson process model (appropriate for continuous failure time data) is considered.,Following J. M. Finkelstein (ibid. vol.R-32, p.508-11, Dec. 1983) continuous analog estimators are defined for use with the discrete model when there is a constant prespecified number of test trials between system configuration changes. The large-sample properties of these estimators, including consistency and normality, are established. Large-sample standard-error formulas and confidence interval procedures are developed. >

[1]  Calyampudi R. Rao,et al.  Linear Statistical Inference and Its Applications. , 1975 .

[2]  Larry Lee Comparing Rates of Several Independent Weibull Processes , 1980 .

[3]  Paul Gottfried Some Aspects of Reliability Growth , 1987, IEEE Transactions on Reliability.

[4]  Larry H. Crow,et al.  Reliability Analysis for Complex, Repairable Systems , 1975 .

[5]  Jack M. Finkelstein Starting & Limiting Values for Reliability Growth , 1979, IEEE Transactions on Reliability.

[6]  J. M. Finkelstein A Logarithmic Reliability-Growth Model for Single-Mission Systems , 1983, IEEE Transactions on Reliability.

[7]  J. T. Duane Learning Curve Approach to Reliability Monitoring , 1964, IEEE Transactions on Aerospace.

[8]  S. K. Lee,et al.  Some Results on Inference for the Weibull Process , 1978 .

[9]  Radu A. Florescu Comment on: Extension of the Duane Plotting Technique , 1986, IEEE Transactions on Reliability.

[10]  L. J. Bain,et al.  Inferences on the Parameters and Current System Reliability for a Time Truncated Weibull Process , 1980 .

[11]  Bev Littlewood Rationale for a Modified Duane Model , 1984, IEEE Transactions on Reliability.

[12]  Larry H. Crow Methods For Assessing Reliability Growth Potential , 1984 .

[13]  J. J. Higgins,et al.  A Quasi-Bayes Estimate of the Failure Intensity of a Reliability-Growth Model , 1981, IEEE Transactions on Reliability.

[14]  Pentti Jääskeläinen Reliability Growth and Duane Learning Curves , 1982 .

[15]  J. Donelson Cost Model for Testing Program Based on Nonhomogeneous Poisson Failure Model , 1977, IEEE Transactions on Reliability.

[16]  Grady W Miller Confidence Intervals for the Reliability of a Future System Configuration. , 1981 .

[17]  Calyampudi Radhakrishna Rao,et al.  Linear Statistical Inference and its Applications , 1967 .

[18]  D. Peck Extension of the Duane Plotting Technique , 1985, IEEE Transactions on Reliability.

[19]  J. M. Finkelstein Confidence Bounds on the Parameters of the Weibull Process , 1976 .

[20]  William P Clay Maximum Likelihood Estimates for the Discrete Application of the AMSAA Growth Model. , 1987 .

[21]  L. H. Crow Confidence Interval Procedures for the Weibull Process With Applications to Reliability Growth , 1982 .