Proton Test Guideline Development – Lessons Learned

[1]  George Jaffé,et al.  Zur Theorie der Ionisation in Kolonnen , 1913 .

[2]  J. Lindhard,et al.  INTEGRAL EQUATIONS GOVERNING RADIATION EFFECTS. (NOTES ON ATOMIC COLLISIONS, III) , 1963 .

[3]  J. I. Vette,et al.  AP-8 trapped proton environment for solar maximum and solar minimum. [Computer accessible models , 1976 .

[4]  H.W. Kraner,et al.  Radiation detection and measurement , 1981, Proceedings of the IEEE.

[5]  Susan Wood,et al.  Simulation of Radiation Damage in Solids , 1981, IEEE Transactions on Nuclear Science.

[6]  Edward A. Burke,et al.  Energy Dependence of Proton-Induced Displacement Damage in Silicon , 1986, IEEE Transactions on Nuclear Science.

[7]  P. S. Winokur,et al.  Total-Dose Radiation and Annealing Studies: Implications for Hardness Assurance Testing , 1986, IEEE Transactions on Nuclear Science.

[8]  George A Ausman Field Dependence of Geminate Recombination in a Dielectric Medium. , 1987 .

[9]  P. W. Marshall,et al.  Correlation of Particle-Induced Displacement Damage in Silicon , 1987, IEEE Transactions on Nuclear Science.

[10]  R. Koga,et al.  Heavy ion induced snapback in CMOS devices , 1989 .

[11]  Cheryl J. Dale,et al.  Displacement damage extremes in silicon depletion regions , 1989 .

[12]  J. R. Srour,et al.  Enhanced displacement damage effectiveness in irradiated silicon devices , 1989 .

[13]  Cheryl J. Dale,et al.  Proton-induced displacement damage distributions and extremes in silicon microvolumes charge injection device , 1990 .

[14]  Cheryl J. Dale,et al.  Particle-induced spatial dark current fluctuations in focal plane arrays , 1990 .

[15]  B. Johlander,et al.  Techniques for minimizing space proton damage in scientific charge coupled devices , 1991 .

[16]  Edmund K. Banghart,et al.  A model for charge transfer in buried-channel charge-coupled devices at low temperature , 1991 .

[17]  R. L. Pease,et al.  Trends in the total-dose response of modern bipolar transistors , 1992 .

[18]  G. R. Hopkinson,et al.  Cobalt60 and proton radiation effects on large format, 2-D, CCD arrays for an Earth imaging application , 1992 .

[19]  P. W. Marshall,et al.  Displacement damage effects in mixed particle environments for shielded spacecraft CCDs , 1993 .

[20]  H. Henschel,et al.  Radiation effects in light emitting diodes, laser diodes, photodiodes, and optocouplers , 1993, RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3).

[21]  Joseph Carbone,et al.  New low-noise, random access, radiation-resistant and large-format charge-injection device (CID) imagers , 1993, Electronic Imaging.

[22]  Stephen LaLumondiere,et al.  Observation of single event upsets in analog microcircuits , 1993 .

[23]  P. Garnier,et al.  Total dose failures in advanced electronics from single ions , 1993 .

[24]  G. R. Hopkinson,et al.  Random telegraph signals from proton-irradiated CCDs , 1993 .

[25]  Allan H. Johnston,et al.  Total dose effects in conventional bipolar transistors and linear integrated circuits , 1994 .

[26]  C. Poivey,et al.  Characterization of single hard errors (SHE) in 1 M-bit SRAMs from single ion , 1994 .

[27]  James R. Janesick,et al.  Sandbox CCDs , 1995, Electronic Imaging.

[28]  Robert A. Reed,et al.  Effects of geometry on the proton SEU dependence on the angle of incidence , 1995 .

[29]  G. R. Hopkinson,et al.  Further measurements of random telegraph signals in proton irradiated CCDs , 1995 .

[30]  Cheryl J. Dale,et al.  Particle-induced mitigation of SEU sensitivity in high data rate GaAs HIGFET technologies , 1995 .

[31]  Daniel M. Fleetwood A first-principles approach to total-dose hardness assurance , 1995 .

[32]  C. F. Wheatley,et al.  Experimental studies of single-event gate rupture and burnout in vertical power MOSFETs , 1996 .

[33]  Allan H. Johnston,et al.  The influence of VLSI technology evolution on radiation-induced latchup in space systems , 1996 .

[34]  E. L. Petersen,et al.  Approaches to proton single-event rate calculations , 1996 .

[35]  Charles E. Barnes,et al.  Total dose and proton damage in optocouplers , 1996 .

[36]  Robert Ecoffet,et al.  An empirical model for predicting proton induced upset , 1996 .

[37]  P. Marshall,et al.  Proton effects in charge-coupled devices , 1996 .

[38]  J.P. Spratt,et al.  The effects of nuclear radiation on P-channel CCD imagers , 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.

[39]  A. H. Johnston,et al.  Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation , 1998 .

[40]  C. I. Lee,et al.  Proton damage effects in linear integrated circuits , 1998 .

[41]  C. F. Wheatley,et al.  Proton-induced dielectric breakdown of power MOSFETs , 1998 .

[42]  C. Foster,et al.  Comparison of Indiana University Cyclotron Facility Faraday cup proton dosimetry with radiochromic films, a calorimeter, and a calibrated ion chamber , 1999 .

[43]  Paul W. Marshall,et al.  PROTON EFFECTS AND TEST ISSUES FOR SATELLITE DESIGNERS: DISPLA CEMENT EFFECTS , 1999 .

[44]  A. H. Johnston,et al.  Proton damage in linear and digital optocouplers , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

[45]  Pradeep Mitra Ecspe,et al.  REPORT NO , 2001 .

[46]  S. Khanna,et al.  Correlation of proton radiation damage in InGaAs-GaAs quantum-well light-emitting diodes , 2001 .

[47]  Robert J. Walters,et al.  NIEL and damage correlations for high-energy protons in gallium arsenide devices , 2001 .

[48]  C.M. Castaneda Crocker Nuclear Laboratory (CNL) radiation effects measurement and test facility , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

[49]  I. Jun,et al.  Displacement damage in silicon due to secondary neutrons, pions, deuterons, and alphas from proton interactions with materials , 2001 .

[50]  Insoo Jun,et al.  Effects of secondary particles on the total dose and the displacement damage in space proton environments , 2001 .

[51]  R. L. Pease,et al.  Comparison of pMOSFET total dose response for Co-60 gammas and high-energy protons , 2001 .