Testing VLSI circuits from VHDL descriptions

The authors describe a new testing strategy for VLSI digital circuits, based on the use of a hardware description language as an input file. The advantages of this method are pointed out. Circuits are described using the standard hardware description language VHDL. A behavioral fault model is proposed, defined as a perturbation of the VHDL code, and evaluated using a classical fault model as a reference. A description of all the tools required to achieve a complete testing system for high complexity circuits is provided. The approaches that have appeared in previous references are discussed.<<ETX>>

[1]  Sumit Ghosh,et al.  On behavior fault modeling for digital designs , 1991, J. Electron. Test..

[2]  J. Paul Roth,et al.  Diagnosis of automata failures: a calculus and a method , 1966 .

[3]  R. L. Wadsack,et al.  Fault modeling and logic simulation of CMOS and MOS integrated circuits , 1978, The Bell System Technical Journal.

[4]  Premachandran R. Menon,et al.  Test Generation Algorithms for Computer Hardware Description Languages , 1982, IEEE Transactions on Computers.

[5]  R. Damiano,et al.  Logic synthesis for ASICs , 1991, IEEE Spectrum.

[6]  Raul Camposano,et al.  VHDL as input for high-level synthesis , 1991, IEEE Design & Test of Computers.

[7]  Hideo Fujiwara,et al.  On the Acceleration of Test Generation Algorithms , 1983, IEEE Transactions on Computers.