A 50-ns 16-Mb DRAM with a 10-ns data rate and on-chip ECC

A high-speed 16-Mb DRAM chip with on-chip error-correcting code (ECC), which supports either 11/11 or 12/0 RAS/CAS addressing and operates on a 3.3- or 5-V power supply, is described. It can be packaged as a 2-Mb*8, 4-Mb*4, 8-Mb*2, or 16-Mb*1 DRAM, And is capable of operating in fast page mode, static column mode, or toggle mode. Speed and flexibility are achieved by a pipeline layout and on-chip SRAMs that buffer entire ECC words. The use of redundant word and bit lines in conjunction with the ECC produces a synergistic fault-tolerance effect. >

[1]  H. J. Boll,et al.  Optimization of the latching pulse for dynamic flip-flop sensors , 1974 .

[2]  A. Chen Redundancy in LSI memory array , 1969 .

[3]  R. Cenker,et al.  A fault-tolerant 64K dynamic RAM , 1979, 1979 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[4]  K. Hoffmann,et al.  Optimized sensing scheme of DRAMs , 1989 .

[5]  D. Horak,et al.  A high performance 16-Mb DRAM technology , 1990, Digest of Technical Papers.1990 Symposium on VLSI Technology.

[6]  K. Natori Sensitivity of dynamic MOS flip-flop sense amplifiers , 1986, IEEE Transactions on Electron Devices.

[7]  S. E. Schuster Multiple word/bit line redundancy for semiconductor memories , 1978 .

[8]  T. Mano,et al.  A submicron VLSI memory with a 4b-at-a-time built-in ECC circuit , 1984, 1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[9]  John A. Fifield A High-Speed On-Chip ECC System Using Modified Hamming Code , 1990, ESSCIRC '90: Sixteenth European Solid-State Circuits Conference.

[10]  R. Kraus,et al.  Analysis and reduction of sense-amplifier offset , 1989 .

[11]  Pinaki Mazumder,et al.  Design of a Fault-Tolerant DRAM with New On-Chip ECC , 1989 .

[12]  Niantsu Wang On the design of MOS dynamic sense amplifiers , 1982 .

[13]  Sunlin Chou,et al.  Fault tolerant techniques for memory components , 1985, 1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[14]  J. Yamada Selector-line merged built-in ECC technique for DRAMs , 1987 .

[15]  L. Heller,et al.  Cascode voltage switch logic: A differential CMOS logic family , 1984, 1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[16]  Y. Taur,et al.  A variable-size shallow trench isolation (STL) technology with diffused sidewall doping for submicron CMOS , 1988, Technical Digest., International Electron Devices Meeting.

[17]  K. Arimoto,et al.  A built-in Hamming code ECC circuit for DRAMs , 1989 .

[18]  Toshio Yamada,et al.  A 4-Mbit DRAM with 16-bit concurrent ECC , 1988 .

[19]  R.P. Cenker,et al.  A fault-tolerant 64K dynamic random-access memory , 1979, IEEE Transactions on Electron Devices.