Modeling of an EMC test-bench for conducted emissions in solid state applications
暂无分享,去创建一个
[1] Lei Wang,et al. A practical approach to modeling skin effect in on-chip interconnects , 2004, GLSVLSI '04.
[2] D. P. Neikirk,et al. Compact equivalent circuit model for the skin effect , 1996, 1996 IEEE MTT-S International Microwave Symposium Digest.
[3] T. Williams,et al. Best practice use of the CISPR AMN/LISN , 1999 .
[4] D. Casadei,et al. Common- and differential-mode HF current components in AC motors supplied by voltage source inverters , 2004, IEEE Transactions on Power Electronics.
[5] R. Fischl,et al. A high power circuit model for the gate turn off thyristor , 1990, 21st Annual IEEE Conference on Power Electronics Specialists.
[6] Yehea I. Ismail,et al. Modeling skin and proximity effects with reduced realizable RL circuits , 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[7] Domenico Casadei,et al. Equivalent circuit of mush wound AC windings for high frequency analysis , 1997, ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics.