Reliability optimization of electronics module by derating using genetic algorithm

This paper explores new way of achieving targeted reliability of any electronics module by a practice of derating. Derating is most promising and efficient technique of improving reliability of any electronics module as it replaces overstressed electronics components with under stressed components without unnecessarily increasing complexity and weight of the module. Derating practice combine with genetic optimization technique is used on a full bridge converter circuit for attaining targeted reliability in minimum possible cost. In a proposed simulated electronics module, all sort of stress factors (Voltage stress factor, Current stress factor, power stress factor and temperature stress factor) applied on components of a simulated module has been factored in. Reliability optimization problems involve a complex method of selection of components with multiple choices that produces desired result. A Genetic Algorithm method has been applied on Full Bridge Converter Circuit to demonstrate its usefulness and efficiency in achieving set reliability in minimum cost. This proposed method is more promising and efficient than the other methods of reliability optimization such as redundancy allocation as it does not increase the overall complexity and weight of the system.