Structure and chemistry of SiOx (x<2) systems

[1]  F. Yubero,et al.  Chemical stability of Sin+ species in SiOx (x<2) thin films , 2001 .

[2]  F. Yubero,et al.  Spectroscopic characterisation and chemical reactivity of silicon monoxide layers deposited on Cu(100) , 2000 .

[3]  F. Yubero,et al.  Anomalous behaviour in resonant Auger emission of SiOx thin films , 1999 .

[4]  Yi Shi,et al.  Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals , 1998 .

[5]  Peter R. Herman,et al.  X-ray emission spectroscopic studies of silicon precipitation in surface layer of SiO2 induced by argon excimer laser irradiation , 1998 .

[6]  M. Suemitsu,et al.  Real-time measurements of Si 2 p core level during dry oxidation of Si(100) , 1998 .

[7]  D. P. Woodruff,et al.  Scanning tunnelling microscopy investigation of the oxygen-induced faceting and “nano-faceting” of a vicinal copper surface , 1997 .

[8]  J. Shallenberger.  Determination of chemistry and microstructure in SiOx (0.1 , 1996 .

[9]  J. West,et al.  MOLECULAR ORBITAL MODELS OF SILICA , 1995 .

[10]  Ankudinov,et al.  Multiple-scattering calculations of x-ray-absorption spectra. , 1995, Physical review. B, Condensed matter.

[11]  P. Picozzi,et al.  SiOx surface stoichiometry by XPS: A comparison of various methods , 1994 .

[12]  P. Mutin,et al.  Sol-gel route to silicon suboxides. Preparation and characterization of silicon sesquioxide , 1991 .

[13]  F. J. Himpsel,et al.  Microscopic structure of the SiO 2 /Si interface , 1988 .

[14]  Bell,et al.  Photoemission study of SiOx (0 <= x <= 2) alloys. , 1988, Physical review. B, Condensed matter.

[15]  Franz J. Himpsel,et al.  Probing the transition layer at the SiO2‐Si interface using core level photoemission , 1984 .

[16]  Y. Jugnet,et al.  Effect of heat treatment on chemical and electronic structure of solid SiO : An electron spectroscopy study , 1977 .