A Transmission Electron Microscopy Investigation of GaN grown on Patterned, Step-Free 4H-SiC Mesas
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P. Neudeck | C. Eddy | M. Twigg | R. Henry | N. Bassim | M. Mastro | J. Powell | A. J. Trunek | R.N. Holm
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P. Neudeck | C. Eddy | M. Twigg | R. Henry | N. Bassim | M. Mastro | J. Powell | A. J. Trunek | R.N. Holm