Testing embedded RAMs in ASIC chips
暂无分享,去创建一个
The problems, issues, and solutions for testing RAMs which are embedded in ASIC chips are presented. Testing RAMs requires a test strategy different from that used to test random logic because RAMs have more fault types. In general, for a given fault model such as the stuck-at one/zero model, testing a RAM requires more test vectors than testing a random-logic circuit of the same number of equivalent gates. Embedded RAMs are even more difficult to test because of the limited access to the original nodes of the RAMs.<<ETX>>
[1] B. Nadeau-Dostie,et al. A serial interfacing technique for built-in and external testing of embedded memories , 1989, 1989 Proceedings of the IEEE Custom Integrated Circuits Conference.
[2] Magdy S. Abadir,et al. Functional Testing of Semiconductor Random Access Memories , 1983, CSUR.