An optimal probe testing algorithm for the connectivity verification of MCM substrates

The k-probe testing methodology is an effective approach to detect open and short faults in MCM substrates. We propose an algorithm which generates the minimum number of tests for complete open fault coverage. For k equals two, the algorithm is able to reduce the test size by up to 50% comparing with that generated by an ordinary approach. A multi-dimensional traveling salesman problem formulation is devised to oplimize probe routes. The approach has been tested on existin,g substrate testers, and has achieved excellent results.