Sifting Method of Defect Candidate on Coated Automobile Roofs based on Binarization and Brightness Difference
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T. Akashi | Kazuaki Fukushima | Yuki Yamamoto | Y. Endo | Jing Zhang | Akiyoshi Ito | Hirokazu Oosawa
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T. Akashi | Kazuaki Fukushima | Yuki Yamamoto | Y. Endo | Jing Zhang | Akiyoshi Ito | Hirokazu Oosawa