Radiation effects in a fixed-point digital signal processor

Radiation effects in a fixed-point digital signal processor (DSP) from Texas Instruments were studied. Single event upset, single event snapback and total ionizing dose effects were observed and some comparisons to other studies of floating-point DSPs are made.

[1]  R. Koga,et al.  Techniques of Microprocessor Testing and SEU-Rate Prediction , 1985, IEEE Transactions on Nuclear Science.

[2]  R. Koga,et al.  Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors , 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

[3]  Gwan Choi,et al.  The single event upset characteristics of the 486-DX4 microprocessor , 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.

[4]  K. LaBel,et al.  Single event effect testing of the Intel 80386 family and the 80486 microprocessor , 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.

[5]  R. Koga,et al.  Heavy ion induced snapback in CMOS devices , 1989 .

[6]  R. Koga,et al.  Single event functional interrupt (SEFI) sensitivity in microcircuits , 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).