论文信息 - An Automated Test System for MNOS Transistor Characterization

An Automated Test System for MNOS Transistor Characterization

An automated and thorough characterization of MNOS transistors has been made possible by using a calculator-based instrumentation system. Fast pulse techniques are used to obtain maximum information and minimize reading disturbance during measurements. Device characteristics such as retention, endurance, and mobility can be obtained with minimal manual interaction.

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