论文信息 - Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors - 字舞流文

Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors

R. Waser | S. Tiedke | M. Grossmann | R. Ramesh | C. Ganpule | T. Schneller | A. Roelofs | K. Prume | T. Schmitz | U. Kall | A. Stanishefsky