STEM_CELL: a software tool for electron microscopy: part 2--analysis of crystalline materials.

A new graphical software (STEM_CELL) for analysis of HRTEM and STEM-HAADF images is here introduced in detail. The advantage of the software, beyond its graphic interface, is to put together different analysis algorithms and simulation (described in an associated article) to produce novel analysis methodologies. Different implementations and improvements to state of the art approach are reported in the image analysis, filtering, normalization, background subtraction. In particular two important methodological results are here highlighted: (i) the definition of a procedure for atomic scale quantitative analysis of HAADF images, (ii) the extension of geometric phase analysis to large regions up to potentially 1μm through the use of under sampled images with aliasing effects.

[1]  M. L. Curri,et al.  Seeded growth of asymmetric binary nanocrystals made of a semiconductor TiO2 rodlike section and a magnetic gamma-Fe2O3 spherical domain. , 2006, Journal of the American Chemical Society.

[2]  P. Galindo,et al.  An approach to the systematic distortion correction in aberration‐corrected HAADF images , 2006, Journal of microscopy.

[3]  Vincenzo Grillo,et al.  Nonhydrolytic synthesis of high-quality anisotropically shaped brookite TiO2 nanocrystals. , 2008, Journal of the American Chemical Society.

[4]  L. Manna,et al.  Z-contrast STEM 3D Information by Abel transform in Systems with Rotational Symmetry , 2008 .

[5]  Juri Barthel,et al.  Aberration measurement in HRTEM: implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns. , 2010, Ultramicroscopy.

[6]  A. Giulietti,et al.  A generalization of Abel inversion to non-axisymmetric density distribution , 2001 .

[7]  J. E. Dorband,et al.  Comparing restored HST and VLA imagery of R Aquarii. [Hubble Space Telescope , 1992 .

[8]  Daniel Rueckert,et al.  Diffeomorphic Registration Using B-Splines , 2006, MICCAI.

[9]  V Grillo.  An advanced study of the response of ADF detector , 2011 .

[10]  P. Galindo,et al.  Quantitative Strain Mapping Applied to Aberration-Corrected HAADF Images , 2006, Microscopy and Microanalysis.

[11]  N. H. Abel.  Auflösung einer mechanischen Aufgabe. , 1826 .

[12]  S. Haigh,et al.  Exceeding Conventional Resolution Limits in High-Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration , 2010, Microscopy and Microanalysis.

[13]  P. Midgley,et al.  Electron tomography and holography in materials science. , 2009, Nature materials.

[14]  P. Ruterana,et al.  Extracting quantitative information from high resolution electron microscopy , 2001 .

[15]  Vincenzo Grillo,et al.  Influence of the static atomic displacement on atomic resolution Z-contrast imaging , 2008 .

[16]  Yimei Zhu,et al.  Scanning moiré fringe imaging by scanning transmission electron microscopy. , 2010, Ultramicroscopy.

[17]  Andrés Yáñez,et al.  The Peak Pairs algorithm for strain mapping from HRTEM images. , 2007, Ultramicroscopy.

[18]  Martin Hÿtch,et al.  Quantitative measurement of displacement and strain fields from HREM micrographs , 1998 .

[19]  A. Thust,et al.  Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy , 1996 .

[20]  Susanne Stemmer,et al.  Experimental quantification of annular dark-field images in scanning transmission electron microscopy. , 2008, Ultramicroscopy.

[21]  C. Dwyer,et al.  Simulation of scanning transmission electron microscope images on desktop computers. , 2010, Ultramicroscopy.

[22]  Vincenzo Grillo,et al.  InAs/InSb nanowire heterostructures grown by chemical beam epitaxy , 2009, Nanotechnology.

[23]  Lucas J. van Vliet,et al.  Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy , 2012 .

[24]  Rafal E Dunin-Borkowski,et al.  A simple algorithm for measuring particle size distributions on an uneven background from TEM images. , 2011, Ultramicroscopy.

[25]  A. Locatelli,et al.  Surface compositional gradients of InAs∕GaAs quantum dots , 2005 .

[26]  William H. Richardson,et al.  Bayesian-Based Iterative Method of Image Restoration , 1972 .

[27]  Pennycook,et al.  Crystal structure retrieval by maximum entropy analysis of atomic resolution incoherent images , 1999, Journal of microscopy.

[28]  Dmitri O. Klenov,et al.  Contributions to the contrast in experimental high-angle annular dark-field images. , 2006, Ultramicroscopy.

[29]  Clinton S Potter,et al.  ACE: automated CTF estimation. , 2005, Ultramicroscopy.

[30]  P. Nellist,et al.  Direct observation of the core structures of threading dislocations in GaN , 1998 .

[31]  P. Batson,et al.  Artifacts in aberration-corrected ADF-STEM imaging. , 2003, Ultramicroscopy.

[32]  Munther A. Gdeisat,et al.  Fast two-dimensional phase-unwrapping algorithm based on sorting by reliability following a noncontinuous path. , 2002, Applied optics.

[33]  S. Kaiser,et al.  Digital analysis of high resolution transmission electron microscopy lattice images , 1996 .

[34]  H. Sawada,et al.  Measurement method of aberration from Ronchigram by autocorrelation function. , 2008, Ultramicroscopy.

[35]  M. Hytch,et al.  Analysis of Variations in Structure from High Resolution Electron Microscope Images by Combining Real Space and Fourier Space Information , 1997 .

[36]  Detlef Hommel,et al.  Composition mapping in InGaN by scanning transmission electron microscopy. , 2011, Ultramicroscopy.

[37]  D. Gerthsen,et al.  Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images , 1997 .

[38]  M. Shiojiri,et al.  Deconvolution processing of HAADF STEM images. , 2002, Ultramicroscopy.

[39]  V. Grillo,et al.  Simultaneous experimental evaluation of In and N concentrations in InGaAsN quantum wells , 2001 .

[40]  D. Gerthsen,et al.  Composition evaluation by lattice fringe analysis , 1998 .

[41]  M. Hÿtch,et al.  Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy. , 2001, Ultramicroscopy.

[42]  A. Bleloch,et al.  Direct measurement of composition of buried quantum dots using aberration-corrected scanning transmission electron microscopy , 2006 .

[43]  P. Aken,et al.  An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices , 2010 .

[44]  S. Pennycook,et al.  Column-by-column compositional mapping by Z-contrast imaging. , 2009, Ultramicroscopy.

[45]  Giorgio Biasiol,et al.  Compositional mapping of semiconductor quantum dots and rings , 2011 .

[46]  V. Grillo,et al.  A novel method for focus assessment in atomic resolution STEM HAADF experiments , 2006 .

[47]  J M Carazo,et al.  A method for estimating the CTF in electron microscopy based on ARMA models and parameter adjustment. , 2003, Ultramicroscopy.

[48]  V. Grillo,et al.  Strain, composition and disorder in ADF imaging of semiconductors , 2011 .

[49]  P D Nellist,et al.  Aberration measurement using the Ronchigram contrast transfer function. , 2010, Ultramicroscopy.

[50]  Moshe Deutsch,et al.  Derivative‐free inversion of Abel’s integral equation , 1982 .

[51]  Adrian Avramescu,et al.  Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images. , 2009, Ultramicroscopy.

[52]  D. Cockayne,et al.  An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging , 1997 .

[53]  F. Hüe,et al.  Nanoscale holographic interferometry for strain measurements in electronic devices , 2008, Nature.

[54]  V. Grillo,et al.  STEM_CELL: a software tool for electron microscopy: part 1--simulations. , 2013, Ultramicroscopy.

[55]  V. Grillo,et al.  The effect of surface strain relaxation on HAADF imaging. , 2009, Ultramicroscopy.

[56]  D C Chrzan,et al.  Distortion and segregation in a dislocation core region at atomic resolution. , 2005, Physical review letters.

[57]  V. Grillo,et al.  Atomic-resolution quantitative composition analysis using scanning transmission electron microscopy Z-contrast experiments , 2005 .

[58]  M. Lehmann,et al.  Electron Holography: Applications to Materials Questions , 2007 .