Computer program for determining optical constants of a film on an opaque substrate.
暂无分享,去创建一个
Abstract : A computer program is described that determines the optical constants of silver sulfide tarnish films on an opaque silver substrate. The program uses data from normal incidence reflectance measurements taken on two films of different thickness on silver. The sulfide film thickness were measured ellipsometrically.
[1] J. Bennett,et al. Computational method for determining n and k for a thin film from the measured reflectance, transmittance, and film thickness. , 1966, Applied optics.
[2] Harold E. Bennett,et al. Validity of Ellipsometry for Determining the Average Thickness of Thin, Discontinuous, Absorbing Films* , 1969 .
[3] Harold E. Bennett,et al. Formation and Growth of Tarnish on Evaporated Silver Films , 1969 .
[4] W. Koehler. Multiple-Beam Fringes of Equal Chromatic Order. Part IV. Use of Multilayer Films , 1955 .