论文信息 - Built-in self-test of the VLSI content addressable filestore

Built-in self-test of the VLSI content addressable filestore

The implementation of quasi-exhaustive BlST in a VLSl Content Addressable File Store (CAFS) system built from four ASIC designs and commodity memory chips is described. A novel application of BIST at the system level for improved system reliability and maintenance is discussed.

[1] R. Illman,et al. Built-In Self-Test of the Macrolan Chip , 1989, ITC.

[2] Richard Illman. Self-Tested Data Flow Logic: A New Approach , 1985, IEEE Design & Test of Computers.

[3] Cordt W. Starke,et al. Design for testability and diagnosis in a VLSI CMOS System/370 processor , 1990 .

[4] Paul H. Bardell,et al. Random Testing for Stuck-At Storage Cells in an Embedded Memory , 1984, ITC.

[5] B.I. Dervisoglu,et al. Scan-path architecture for pseudorandom testing , 1989, IEEE Design & Test of Computers.

[6] Steve Hodgson,et al. ASTA-an integrated system for BIST analysis & automatic test generation , 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..

[7] Wilfried Daehn,et al. Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials , 1986, ITC.

[8] Andrzej Krasniewski,et al. Circular self-test path: a low-cost BIST technique for VLSI circuits , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..