Force modulation with a scanning force microscope: an analysis

A magnetic force modulation microscope (FMM) has been employed to measure the dynamic behavior of a contact between a scanning force microscope (SFM) tip and a surface. Our experimental results show the inefficiency of the classical models (two Kelvin-Voigt elements in parallel). A new model which takes into account the normal and tangential stiffness of the contact, and also the geometrical and mechanical properties of the cantilever which hold the tip, is proposed. This model shows that the natural frequency is sensitive to the normal stiffness, only if the ratio of the normal contact stiffness to the cantilever stiffness is between 0.2 and 200. Above this domain, the natural frequency is sensitive to sliding (Mindlin theory).

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