论文信息 - Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers - 字舞流文

Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers

This compendium reports on single-event latchup and total ionizing dose results for a variety of operational amplifiers targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.

Mehran Amrbar | Farokh Irom | Shri G. Agarwal

[1] F. Irom,et al. Catastrophic latchup in a CMOS operational amplifier , 2005, IEEE Transactions on Nuclear Science.

[2] F. Irom,et al. Results of Single-Event Transient Measurements Conducted by the Jet Propulsion Laboratory , 2008, 2008 IEEE Radiation Effects Data Workshop.

[3] S. S. McClure,et al. Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2009-2011 , 2010, 2011 IEEE Radiation Effects Data Workshop.

[4] Richard D. Harris,et al. ELDRS Characterization for a Very High Dose Mission , 2010, 2010 IEEE Radiation Effects Data Workshop.

[5] S. S. McClure,et al. Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions , 2012, 2012 IEEE Radiation Effects Data Workshop.

[6] David F. Heidel,et al. Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems , 2010, 2011 IEEE Radiation Effects Data Workshop.

[7] A. H. Johnston,et al. The effect of temperature on single-particle latchup , 1991 .