Temperature sensors and measurements to test analogue circuits: questions and answers

We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many interesting questions, some of them collected more than once!. Here you have some of them. Our goal in this paper is to introduce temperature measurements and temperature sensors to test analog circuits from the highest level of abstraction. This paper has been written with the goal to provide basic understanding and present some of the possibilities of temperature sensors and measurements to test integrated circuits in general, analog in particular.

[1]  Peter R. Kinget,et al.  Compact and Supply-Voltage-Scalable Temperature Sensors for Dense On-Chip Thermal Monitoring , 2015, IEEE Journal of Solid-State Circuits.

[2]  D. Blackburn Temperature measurements of semiconductor devices - a review , 2004, Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545).

[3]  F. Curatelli,et al.  Three-dimensional transient thermal simulation: application to delayed short circuit protection in power ICs , 1980 .

[4]  Diego Mateo,et al.  On the Use of Static Temperature Measurements as Process Variation Observable , 2012, J. Electron. Test..

[5]  Antonio Rubio,et al.  Applications of temperature phase measurements to IC testing , 2004, Microelectron. Reliab..

[6]  X. Jordà,et al.  Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization. , 2009, Review of Scientific Instruments.

[7]  X. Jordà,et al.  Hot spot analysis in integrated circuit substrates by laser mirage effect , 2011 .

[8]  Miquel Vellvehi,et al.  Steady-state sinusoidal thermal characterization at chip level by internal infrared-laser deflection , 2008 .

[9]  X. Jordà,et al.  Wireless pad-free integrated circuit debugging by powering modulation and lock-in infrared sensing , 2013 .

[10]  X. Jordà,et al.  Irradiance-based emissivity correction in infrared thermography for electronic applications. , 2011, The Review of scientific instruments.

[11]  Antonio Rubio,et al.  Dynamic Surface Temperature Measurements in ICs , 2006, Proceedings of the IEEE.

[12]  Xavier Aragones,et al.  DC Temperature Measurements to Characterize the Central Frequency and 3 dB Bandwidth in mmW Power Amplifiers , 2015, IEEE Microwave and Wireless Components Letters.

[13]  Antonio Rubio,et al.  Analysis of ISSQ/IDDQ testing implementation and circuit partitioning in CMOS cell-based design , 1996, Proceedings ED&TC European Design and Test Conference.

[14]  Salvador Mir,et al.  Testing RF circuits with true non-intrusive built-in sensors , 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[15]  X. Jordà,et al.  Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography , 2013 .

[16]  X. Jordà,et al.  Study of heat sources interacting in integrated circuits by laser mirage effect , 2014 .

[17]  Antonio Rubio,et al.  Four different approaches for the measurement of IC surface temperature: application to thermal testing , 2002 .

[18]  Antonio Rubio,et al.  Thermal coupling in integrated circuits: application to thermal testing , 2001, IEEE J. Solid State Circuits.

[19]  José Silva-Martínez,et al.  Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor , 2011, IEEE Transactions on Circuits and Systems I: Regular Papers.

[20]  Salvador Mir,et al.  Defect-oriented non-intrusive RF test using on-chip temperature sensors , 2013, 2013 IEEE 31st VLSI Test Symposium (VTS).

[21]  Ferran Reverter,et al.  On-Chip MOSFET Temperature Sensor for Electrical Characterization of RF Circuits , 2013, IEEE Sensors Journal.

[22]  G.C.M. Meijer,et al.  Temperature sensors and voltage references implemented in CMOS technology , 2001, IEEE Sensors Journal.

[23]  Ferran Reverter,et al.  MOSFET dynamic thermal sensor for IC testing applications , 2016 .

[24]  Marta Rencz,et al.  Measuring partial thermal resistances in a heat-flow path , 2002 .

[25]  Diego Mateo,et al.  DC temperature measurements for power gain monitoring in RF power amplifiers , 2012, 2012 IEEE International Test Conference.

[26]  E. Dallago,et al.  Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. II. Practice and experiments , 1998 .

[27]  Ferran Reverter,et al.  On-Chip Thermal Testing Using MOSFETs in Weak Inversion , 2015, IEEE Transactions on Instrumentation and Measurement.

[28]  Shahin Nazarian,et al.  Thermal Modeling, Analysis, and Management in VLSI Circuits: Principles and Methods , 2006, Proceedings of the IEEE.

[29]  Marvin Onabajo,et al.  Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling , 2014, J. Electron. Test..

[30]  Katsuo Kurabayashi,et al.  Precision measurement and mapping of die-attach thermal resistance , 1998 .

[31]  Dean Lewis,et al.  Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe , 1994 .

[32]  X. Aragones,et al.  Temperature Sensors to Measure the Central Frequency and 3 dB Bandwidth in mmW Power Amplifiers , 2014, IEEE Microwave and Wireless Components Letters.

[33]  X. Jorda,et al.  Chapter 13:Thermal Issues in Microelectronics , 2015 .

[34]  Ferran Reverter,et al.  MOSFET temperature sensors for on-chip thermal testing , 2013 .

[35]  Florin Udrea,et al.  Silicon diode temperature sensors - A review of applications , 2015 .

[36]  N. Mestres,et al.  Hot-Spot Detection in Integrated Circuits by Substrate Heat-Flux Sensing , 2008, IEEE Electron Device Letters.

[37]  Eric Kerherve,et al.  Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor , 2012, 2012 Proceedings of the ESSCIRC (ESSCIRC).

[38]  N. Mestres,et al.  Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect. , 2010, Optics letters.

[39]  V. d'Alessandro,et al.  Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors , 2004, IEEE Journal of Solid-State Circuits.

[40]  E. Aldrete-Vidrio,et al.  Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements , 2010 .

[41]  Kevin Skadron,et al.  Temperature-to-power mapping , 2010, 2010 IEEE International Conference on Computer Design.

[42]  A. Hajimiri,et al.  Integrated Self-Healing for mm-Wave Power Amplifiers , 2013, IEEE Transactions on Microwave Theory and Techniques.

[43]  José Luis González,et al.  Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors , 2013 .

[44]  Xavier Jordà,et al.  Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging , 2015, IEEE Transactions on Industrial Electronics.

[45]  Antonio Rubio,et al.  Thermal testing: fault location strategies , 2000, Proceedings 18th IEEE VLSI Test Symposium.

[46]  N. Mestres,et al.  FAST TRACK COMMUNICATION: Laser beam deflection-based perimeter scanning of integrated circuits for local overheating location , 2009 .

[47]  Xi Wang,et al.  Power Trace: An Efficient Method for Extracting the Power Dissipation Profile in an IC Chip From Its Temperature Map , 2009, IEEE Transactions on Components and Packaging Technologies.

[48]  J. Altet,et al.  Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes , 2014, 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS).