Determining index of refraction from polarimetric hyperspectral radiance measurements

Polarimetric hyperspectral imaging (P-HSI) combines two of the most common remote sensing modalities. This work leverages the combination of these techniques to improve material classification. Classifying and identifying materials requires parameters which are invariant to changing viewing conditions, and most often a material’s reflectivity or emissivity is used. Measuring these most often requires assumptions be made about the material and atmospheric conditions. Combining both polarimetric and hyperspectral imaging, we propose a method to remotely estimate the index of refraction of a material. In general, this is an underdetermined problem because both the real and imaginary components of index of refraction are unknown at every spectral point. By modeling the spectral variation of the index of refraction using a few parameters, however, the problem can be made overdetermined. A number of different functions can be used to describe this spectral variation, and some are discussed here. Reducing the number of spectral parameters to fit allows us to add parameters which estimate atmospheric downwelling radiance and transmittance. Additionally, the object temperature is added as a fit parameter. The set of these parameters that best replicate the measured data is then found using a bounded Nelder-Mead simplex search algorithm. Other search algorithms are also examined and discussed. Results show that this technique has promise but also some limitations, which are the subject of ongoing work.