Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies

In this paper, we surveyed the recent advancements in DDYA, which includes scan-based diagnosis technologies and diagnosis driven yields analysis. Multiple industrial cases studies are given to illustrate the values of the DDYA flow. By using the advanced DDYA, diagnosis can be more accurate, fast and informative. More importantly it can help improve yield by finding the systematic defect, identifying the root causes, correlating diagnosis results with DFM and picking highly possible die and suspect for PFA to validate all the findings.

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