论文信息 - Open Resonator Technique for Measurement of Thin Dielectric Film Properties on Optically Dense Substrates - 字舞流文

Open Resonator Technique for Measurement of Thin Dielectric Film Properties on Optically Dense Substrates

J. Tuovinen | A. Räisänen | D. Lioubtchenko | J. Mallat | S. N. Dudorov

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