A New Method for the Measurement of Thickness in Single Crystals

[1]  I. Pozsgai.  Thickness determination by measuring electron transmission in the TEM at 200kV , 1997 .

[2]  M. Gibson,et al.  Dynamical electron diffraction analysis of lattice parameters, Debye—Waller factors and order in Ti-Al and Ti-Ga alloys , 1996 .

[3]  P. Midgley,et al.  The use of Bethe potentials in zone-axis CBED pattern matching , 1996 .

[4]  J. Mayer,et al.  Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction , 1994 .

[5]  J. Zuo.  Automated structure‐factor refinement from convergent‐beam electron diffraction patterns , 1993 .

[6]  J. Zuo,et al.  Measurement of individual structure‐factor phases with tenth‐degree accuracy: the 00.2 reflection in BeO studied by electron and X‐ray diffraction , 1993 .

[7]  D. Bird,et al.  Sensitivity and accuracy of CBED pattern matching , 1992 .

[8]  A. Weickenmeier,et al.  Computation of absorptive form factors for high-energy electron diffraction , 1991 .

[9]  J. Mansfield.  Practical phase identification by convergent beam electron diffraction. , 1989, Journal of electron microscopy technique.

[10]  J. Taftø,et al.  ALCHEMI: a new technique for locating atoms in small crystals , 1983 .

[11]  A. Howie,et al.  Electron Microscopy of Thin Crystals , 1977, Nature.

[12]  J. Venables,et al.  Developments in Electron Microscopy and Analysis , 1977 .

[13]  P. Kelly,et al.  The determination of foil thickness by scanning transmission electron microscopy , 1975 .

[14]  G. Lorimer,et al.  The quantitative analysis of thin specimens , 1975 .

[15]  K. Botros.  A METHOD FOR DETERMINING FOIL THICKNESSES IN TEM BY USING CONVERGENT BEAM ELECTRON DIFFRACTION UNDER WEAK BEAM CONDITIONS , 1995 .

[16]  Pierre Stadelmann,et al.  EMS-A software package for electron diffraction analysis and HREM image simulation in materials science , 1987 .