Scanning voltage microscopy on active semiconductor lasers: the impact of doping profile near an epitaxial growth interface on series resistance
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D. Ban | K. Hinzer | J.K. White | K. Hinzer | E. Sargent | J. White | D. Ban | A. Springthorpe | E.H. Sargent | A.J. SpringThorpe | St.J. Dixon-Warren | S. Dixon-Warren | S. Dixon‐Warren
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