KKCV-GA-Based Method for Optimal Analog Test Point Selection

A novel diagnosis oriented method for optimal analog test point selection is proposed. The method uses a kernel density estimation on $K$ -nearest neighbors-based cross-validation to evaluate the diagnostic capability of the selected test points, and then employs a genetic algorithm to search the quasi-optimal solution with the maximum diagnostic capability under a limited number of test points. Experimental results show that better solutions in terms of the diagnostic accuracies of the advanced intelligent classifiers can be obtained, and the knowledge of critical test points is revealed, which supports further improvement of the optimization, not only to increase the probability of reaching the global optimal solutions but also to reduce the time costs. In addition, with the precise estimation of the diagnostic capability, the proposed method can also be used to verify the results produced by other methods in this field.

[1]  Fang Chen,et al.  Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis , 2011, IEEE Transactions on Instrumentation and Measurement.

[2]  Stefano Manetti,et al.  Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits , 1999 .

[3]  Dongsheng Zhao,et al.  Chaotic binary bat algorithm for analog test point selection , 2015, Analog Integrated Circuits and Signal Processing.

[4]  Camelia Hora,et al.  Diagnosis of Local Spot Defects in Analog Circuits , 2012, IEEE Transactions on Instrumentation and Measurement.

[5]  Kaiyu Qin,et al.  Quantum-inspired evolutionary algorithm for analog test point selection , 2013 .

[6]  Dongsheng Zhao,et al.  A new test points selection method for analog fault dictionary techniques , 2015 .

[7]  P. M. Lin,et al.  Analogue circuits fault dictionary. New approaches and implementation , 1985 .

[8]  Gavin C. Cawley,et al.  Efficient leave-one-out cross-validation of kernel fisher discriminant classifiers , 2003, Pattern Recognit..

[9]  Ragab A. El Sehiemy,et al.  Multi-objective fuzzy-based procedure for enhancing reactive power management , 2013 .

[10]  Dongsheng Zhao,et al.  A New Test Point Selection Method for Analog Circuit , 2015, J. Electron. Test..

[11]  Andrzej Pulka.  Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses , 2011 .

[12]  Kaiyu Qin,et al.  A general method for analog test point selection using multi-frequency analysis , 2015 .

[13]  Rob A. Rutenbar,et al.  A Tutorial Introduction to Research on Analog and MixedSignal Circuit Testing , 2002 .

[14]  Kaiyu Qin,et al.  Greedy randomized adaptive search procedure for analog test point selection , 2014, Analog Integrated Circuits and Signal Processing.

[15]  Karim Mohammadi,et al.  Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach , 2009, Microelectron. Reliab..

[16]  Cheng-Long Chuang,et al.  A Hybrid Memetic Framework for Coverage Optimization in Wireless Sensor Networks , 2015, IEEE Transactions on Cybernetics.

[17]  Yuanyuan Jiang,et al.  A New Optimal Test Node Selection Method for Analog Circuit , 2012, J. Electron. Test..

[18]  Dong Liu,et al.  Entropy-based optimum test points selection for analog fault dictionary techniques , 2004, IEEE Transactions on Instrumentation and Measurement.

[19]  Shulin Tian,et al.  Multidimensional Fitness Function DPSO Algorithm for Analog Test Point Selection , 2010, IEEE Transactions on Instrumentation and Measurement.

[20]  Yongzhao Zhan,et al.  Improved pseudo nearest neighbor classification , 2014, Knowl. Based Syst..

[21]  Bing Long,et al.  A test points selection method for analog fault dictionary techniques , 2010 .

[22]  E. Petriu,et al.  Fuzzy logic-based adaptive gravitational search algorithm for optimal tuning of fuzzy-controlled servo systems , 2013 .

[23]  L. S. Milor,et al.  A tutorial introduction to research on analog and mixed-signal circuit testing , 1998 .

[24]  Aiqiang Xu,et al.  Practical Analog Circuit Diagnosis Based on Fault Features with Minimum Ambiguities , 2016, J. Electron. Test..

[25]  V. C. Prasad,et al.  Selection of test nodes for analog fault diagnosis in dictionary approach , 2000, IEEE Trans. Instrum. Meas..

[26]  Bing Long,et al.  Diagnostics and Prognostics Method for Analog Electronic Circuits , 2013, IEEE Transactions on Industrial Electronics.

[27]  Fang Chen,et al.  A Novel Test Point Selection Method for Analog Fault Dictionary Techniques , 2010, J. Electron. Test..

[28]  Jerzy Rutkowski,et al.  Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection , 2007, IEEE Transactions on Circuits and Systems II: Express Briefs.

[29]  Aiqiang Xu,et al.  Multi-class classification using kernel density estimation on K-nearest neighbours , 2016 .

[30]  Shulin Tian,et al.  Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques , 2009, IEEE Transactions on Instrumentation and Measurement.

[31]  M. C. Jones,et al.  A Brief Survey of Bandwidth Selection for Density Estimation , 1996 .